Thermal Testing of Integrated Circuits [Kindle-editie]

Temperature has been always considered as an appreciable magnitude to detect failures in electric systems. In this book, the authors present the feasibility of considering temperature as an observable for testing purposes, with full coverage of the state of the art.

De auteur:J. Altet
Isbn 10:B001GS75A8
Uitgeverij:Springer; 1 editie
Paperback boek:204
serie:Kindle-editie
gewicht Thermal Testing of Integrated Circuits [Kindle-editie]:3778 KB
Nieuwste boeken
© 2024 onlineinet.ru Algemene voorwaarden
BoekreCensies, of takken. Alle rechten voorbehouden.