Failure Analysis of Integrated Circuits: Tools and Techniques (The Springer International Series in Engineering and Computer Science) [Kindle-editie] beoordelingen

Isbn 10: B000QCQX2G

Failure Analysis of Integrated Circuits: Tools and Techniques (The Springer International Series in Engineering and Computer Science) [Kindle-editie] beoordelingen het boek quotes

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Failure Analysis of Integrated Circuits: Tools and Techniques (The Springer International Series in Engineering and Computer Science) [Kindle-editie]

This "must have" reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits.

De auteur:Lawrence C. Wagner
Isbn 10:B000QCQX2G
Uitgeverij:Springer; 1st editie
Paperback boek:255
serie:Kindle-editie
gewicht Failure Analysis of Integrated Circuits: Tools and Techniques (The Springer International Series in Engineering and Computer Science) [Kindle-editie]:5165 KB
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