Radiation dose analysis of NPS Flash X-ray facility using silicon PIN diode (English Edition) [Kindle-editie]

Radiation output of the NPS Flash X-ray facility has been analyzed using commercial silicon PIN diodes. These results have been compared to dosimetry techniques using CaF2 TLDs (thermoluminescent dosimeters). The silicon PIN diodes were irradiated with photon energies of approximately 1 MeV and dose rates up to 1010 rad(Si)/s. These techniques and results can be used to provide real time calibration of the Flash X-ray facility.

De auteur:Bernard L. Jones
Isbn 10:B007LS4H8U
Uitgeverij: Amazon Media EU S.à r.l.
serie:Kindle-editie
gewicht Radiation dose analysis of NPS Flash X-ray facility using silicon PIN diode (English Edition) [Kindle-editie]:4529 KB
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